{"id":1714,"date":"2025-12-16T06:41:16","date_gmt":"2025-12-16T06:41:16","guid":{"rendered":"https:\/\/welleltron.com\/?post_type=product&p=1714"},"modified":"2025-12-26T04:49:30","modified_gmt":"2025-12-26T04:49:30","slug":"hitachi-cmi563-srp-4-probe","status":"publish","type":"product","link":"https:\/\/welleltron.com\/vi\/test-equipment\/srp-4-probe\/hitachi-cmi563-srp-4-probe\/","title":{"rendered":"Hitachi CMI563 SRP-4 Probe"},"content":{"rendered":"

1.Hitachi CMI563 SRP-4 Probe Overview<\/h2>\n

1. Overview of the Hitachi CMI563 SRP-4 Probe\u00a0 <\/span><\/h2>\n

The <\/span>Hitachi CMI563 Probe<\/span><\/b>, specifically the <\/span>SRP-4 measurement probe<\/span> variant, is a specialized sensor engineered for the <\/span>Non-Destructive Testing (NDT)<\/span> of copper layers on printed circuit boards.<\/span> Unlike traditional eddy-current probes that may be affected by the substrate material or the copper on the opposite side of a board, the SRP-4 utilizes a <\/span>Four-Point Probe<\/span> method.<\/span>\u00a0 <\/span><\/p>\n

This tethered probe features a patented design with four securely encased pins.<\/span> Its see-through casing allows for precise placement on small traces, making it an essential tool for PCB Quality Control (QC). Whether you are measuring Electroless Copper or Electrodeposited Copper<\/em>, the SRP-4 ensures that your readings are consistent and reliable.\u00a0 <\/span><\/p>\n

2. Core Features and Technology\u00a0 <\/span><\/h2>\n

Micro-Resistance Measurement\u00a0 <\/span><\/h3>\n

At the heart of the <\/span>Hitachi SRP Probe<\/span> is advanced <\/span>micro-resistance<\/span> technology.<\/span> The probe operates by passing a constant current between the two outer pins while measuring the voltage drop between the two inner pins.<\/span> This 4-wire Kelvin technique eliminates the impact of contact resistance, allowing for High Resolution Thickness data even on very thin foils.\u00a0 <\/span><\/p>\n

Key Specifications:\u00a0 <\/span><\/h3>\n