{"id":1717,"date":"2025-12-16T06:42:51","date_gmt":"2025-12-16T06:42:51","guid":{"rendered":"https:\/\/welleltron.com\/?post_type=product&p=1717"},"modified":"2026-11-03T12:32:31","modified_gmt":"2026-11-03T12:32:31","slug":"hitachi-cmi700-srp-4-probe","status":"publish","type":"product","link":"https:\/\/welleltron.com\/ru\/test-equipment\/srp-4-probe\/hitachi-cmi700-srp-4-probe\/","title":{"rendered":"Hitachi CMI700 SRP-4 Probe"},"content":{"rendered":"
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I. Definition and Core Function of the\u00a0SRP-4 probe<\/span><\/strong><\/h2>\n<\/div>\n
The SRP-4 probe is a contact sensor based on four-wire micro-resistance measurement technology, optimized for measuring copper thickness on PCB surfaces. Unlike traditional mechanical measurement tools (such as micrometers), the SRP-4 uses independent current and voltage transmission paths to completely eliminate interference from wire resistance, enabling precise capture of minute resistance changes.<\/div>\n
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In PCB manufacturing, copper thickness is a key parameter determining circuit performance, reliability, and production yield. The\u00a0Hitachi SRP-4 Probe <\/a><\/span>, a micro-resistance measurement tool specifically designed for copper thickness measurement, has become a key quality control tool in the industry thanks to its high accuracy, non-destructive nature, and real-time data feedback.<\/div>\n
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SRP-4 probe<\/a> Core Technology<\/strong><\/h2>\n

Four-Electrode Ring Array Design<\/strong><\/p>\n

The probe utilizes four independent electrodes arranged in a 90-degree ring. By alternating between applying excitation signals and receiving induced currents, it eliminates measurement errors introduced by traditional two-electrode methods due to contact resistance and edge effects. When inspecting tiny 0.5mm\u00d70.5mm pads, this design reduces repeatability from \u00b10.1\u03bcm to \u00b10.02\u03bcm, meeting the stringent copper thickness consistency requirements of HDI (High Density Interconnect) boards.<\/p>\n

High-Frequency Electromagnetic Coupling and Non-Contact Measurement<\/strong><\/p>\n

Based on the principle of electromagnetic wave penetration in a tunable frequency range of 1MHz to 100MHz, the probe performs inspections without physical contact with the circuit board surface, eliminating the risk of secondary contamination caused by traditional probes, such as scratches on the copper foil and residual metal debris. In use on a server motherboard production line, this technology has increased the copper surface cleanliness pass rate from 92% to 99.8%, reducing short-circuit failures caused by impurities by 80%.<\/p>\n

Multi-physics fusion algorithm<\/strong><\/p>\n

Integrated dynamic compensation model for conductivity, thickness, and temperature. By real-time monitoring of ambient temperature (\u00b10.1\u00b0C accuracy) and copper foil conductivity (\u00b11% error), the system automatically corrects for the effects of thermal expansion and contraction (\u00b10.05\u03bcm\/10\u00b0C) and material batch variations on measurement results. The system maintains \u00b10.03\u03bcm detection accuracy across a wide temperature range of -20\u00b0C to 80\u00b0C, making it suitable for both cleanroom and standard workshop environments.<\/p>\n

Hitachi Srp-4 Probe Core Functions and Performance Advantages<\/strong><\/h2>\n

Submicron Accuracy and Wide Measurement Range Compatibility<\/strong><\/p>\n

Detection accuracy: <\/strong>\u00b10.03\u03bcm (under standard test conditions), capable of detecting thickness fluctuations of ultra-thin copper layers as thin as 0.5\u03bcm.<\/p>\n

Measurement range:<\/strong> 0.5\u03bcm to 5mm, covering diverse requirements from flexible printed circuits (FPCs) to thick copper power boards (such as IGBT module substrates). Resolution: 0.01\u03bcm, enabling precise capture of copper thickness gradients (such as the gradient layer in the electroless copper deposition process).<\/p>\n

High-speed dynamic detection and real-time feedback<\/strong><\/p>\n

Detection speed: <\/strong>Single-point measurement takes \u226430ms, supporting continuous detection at production line speeds (\u2265200mm\/s).<\/p>\n

Data output:<\/strong> Synchronously outputs three parameters: copper thickness, resistivity, and temperature compensation coefficient, providing multi-dimensional data support for process optimization.<\/p>\n

Defect warning: <\/strong>Built-in threshold comparison function automatically triggers an alarm when copper thickness exceeds the design tolerance (e.g., \u00b110%), reducing the flow of defective products to the next process.<\/p>\n

Industrial-grade environmental adaptability and stability<\/strong><\/p>\n

Protection level: <\/strong>The probe body meets IP65 protection standards and has an electromagnetic interference (EMI) resistance of \u2265150V\/m, making it suitable for strong electric field environments (such as near SMT patch lines).<\/p>\n

Material compatibility: <\/strong>Supports detection of various materials, including pure copper (Cu), copper alloys (e.g., C194, KFC), and electroless copper. Calibration cycle: Using laser interferometer calibration technology, a single calibration is valid for up to 6 months, reducing maintenance costs.<\/p>\n

Surface Cooper Srp-4 Probe<\/strong>\u00a0data:<\/strong><\/p>\n

Chemical cooper\uff1a10 \u03bcin \u2013 500 \u03bcin (0.25 \u03bcm \u2013 12.7 \u03bcm)<\/p>\n

electroplating cooper\uff1a0.1 mil \u2013 6 mil (2.5 \u03bcm \u2013 152 \u03bcm)<\/p>\n

lind with range\uff1a8 mil \u2013 250 mil (203 \u03bcm \u2013 6350 \u03bcm)<\/p>\n

accuracy\uff1a\u00b11% (\u00b10.1 \u03bcm)\u00a0according to standard plate<\/p>\n

A<\/strong>ccuracy of Hitachi SRP-4 probe:<\/strong><\/p>\n

chemical cooper\uff1astandard deviation 0.2 %\uff1b<\/p>\n

electroplating cooper\uff1astandard deviation 0.5 %<\/p>\n

resolution\uff1a0.01 mils \u2265 1 mil, 0.001 mils <1 mil,<\/p>\n

0.1 \u03bcm \u2265 10 \u03bcm, 0.01 \u03bcm < 10 \u03bcm, 0.001 \u03bcm < 1 \u03bcm<\/p>\n\n\n\n\n\n\n\n
Brand<\/strong><\/td>\nHitachi<\/td>\n<\/tr>\n
Used on<\/strong><\/td>\nOxford\/Hitachi CMI563,CMI700,CMI760 instrument<\/td>\n<\/tr>\n
Model<\/strong><\/td>\nSRP-4 Probe<\/td>\n<\/tr>\n
MOQ<\/strong><\/td>\n1 PCS<\/td>\n<\/tr>\n
Lead time<\/strong><\/td>\nhave stock<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n
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