{"id":4852,"date":"2026-11-05T09:31:52","date_gmt":"2026-11-05T09:31:52","guid":{"rendered":"https:\/\/welleltron.com\/?page_id=4852"},"modified":"2026-11-05T10:00:23","modified_gmt":"2026-11-05T10:00:23","slug":"flying-probe-test-issues","status":"publish","type":"page","link":"https:\/\/welleltron.com\/fr\/kb\/flying-probe-test-issues\/","title":{"rendered":"Flying Probe Test Issues"},"content":{"rendered":"<style>.kb-table-of-content-nav.kb-table-of-content-id4852_f6fc62-c4 .kb-table-of-content-wrap{padding-top:var(--global-kb-spacing-sm, 1.5rem);padding-right:var(--global-kb-spacing-sm, 1.5rem);padding-bottom:var(--global-kb-spacing-sm, 1.5rem);padding-left:var(--global-kb-spacing-sm, 1.5rem);}.kb-table-of-content-nav.kb-table-of-content-id4852_f6fc62-c4 .kb-table-of-contents-title-wrap{padding-top:0px;padding-right:0px;padding-bottom:0px;padding-left:0px;}.kb-table-of-content-nav.kb-table-of-content-id4852_f6fc62-c4 .kb-table-of-contents-title{font-weight:regular;font-style:normal;}.kb-table-of-content-nav.kb-table-of-content-id4852_f6fc62-c4 .kb-table-of-content-wrap .kb-table-of-content-list{font-weight:regular;font-style:normal;margin-top:var(--global-kb-spacing-sm, 1.5rem);margin-right:0px;margin-bottom:0px;margin-left:0px;}<\/style>\n\n\n<p class=\"wp-block-paragraph\">Flying probe testing checks electrical connections by moving probes to programmed locations on a PCB. Common problems include reported opens, shorts, unstable resistance readings, missed test points, and excessive probe marks. A failed result may indicate a real board defect, a contact problem, or an incorrect test setup. <\/p>\n\n\n\n<h2 class=\"wp-block-heading\">1. Understand What the Flying Probe Test Is Checking<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">A bare-board <a href=\"https:\/\/welleltron.com\/test-equipment\/atg-test-probe\/atg-3a101804-flying-probe\/\">flying probe<\/a> tester evaluates electrical behavior against a defined test program. Continuity testing checks intended connections; isolation testing checks separation between nets under specified conditions. Some systems also offer four-wire Kelvin, high-voltage, or other specialized measurements.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Test coverage depends on the equipment, program, accessible points, and selected test strategy. It should not be assumed that every net pair or every possible failure mechanism is tested. <\/p>\n\n\n\n<figure class=\"wp-block-table\"><table><thead><tr><th>Reported Issue<\/th><th>Possible Board-Related Cause<\/th><th>Possible Test-Related Cause<\/th><\/tr><\/thead><tbody><tr><td>Open circuit<\/td><td>Broken conductor, defective interconnection, incomplete connection<\/td><td>Poor contact, missed pad, incorrect coordinates or netlist<\/td><\/tr><tr><td>High or unstable resistance<\/td><td>Narrowed conductor, marginal interconnection, intermittent defect<\/td><td>Contaminated tip, unstable contact, cable or setup problem<\/td><\/tr><tr><td>Short circuit<\/td><td>Copper bridge, conductive debris, unintended connection<\/td><td>Wrong test location, incorrect net assignment, unintended probe bridging<\/td><\/tr><tr><td>Low isolation resistance<\/td><td>Conductive contamination, moisture-related leakage, dielectric problem<\/td><td>Fixture leakage, contaminated test hardware, unsuitable setup<\/td><\/tr><tr><td>Repeated misses in one area<\/td><td>Local board distortion or registration variation<\/td><td>Fiducial, coordinate, support, or head-alignment problem<\/td><\/tr><tr><td>Excessive probe marks<\/td><td>Surface vulnerable to contact damage<\/td><td>Incorrect tip, excessive engagement, misalignment, repeated probing<\/td><\/tr><tr><td>Longer test time<\/td><td>More failing or difficult-to-contact locations<\/td><td>Additional retries, inefficient path, changed coverage or settings<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Start with the failure record:<\/strong> preserve the board ID, program revision, net names, coordinates, measured value, limits, probe head, and retest history.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">2. False Opens and Intermittent Contact<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">A reported open means the test did not confirm the required connection under the selected conditions. It does not identify the physical cause by itself.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Check in this order<\/strong><\/p>\n\n\n\n<ol start=\"1\" class=\"wp-block-list\">\n<li><strong>Confirm the location:<\/strong> Verify that the programmed point belongs to the intended net and is accessible.<\/li>\n\n\n\n<li><strong>Inspect the contact area:<\/strong> Look for contamination, residual coating, damage, or an unsuitable landing position.<\/li>\n\n\n\n<li><strong>Inspect the probe:<\/strong> Check for a bent tip, wear, deposits, or incorrect installation.<\/li>\n\n\n\n<li><strong>Verify board support:<\/strong> Confirm that the panel does not move or deflect during contact.<\/li>\n\n\n\n<li><strong>Perform a controlled retest:<\/strong> Keep the original result and document any cleaning, alignment, or setting change.<\/li>\n\n\n\n<li><strong>Investigate the circuit:<\/strong> If the failure persists with verified contact, examine the conductor or interconnection using an appropriate method.<\/li>\n<\/ol>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Useful diagnostic clue:<\/strong> failures associated with one test head across different locations suggest checking that head\u2019s contact system. Failures that remain on the same net after contact checks warrant board-focused investigation. Neither pattern is conclusive on its own.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Do not increase contact force or relax the continuity limit simply to obtain a pass.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">3. High Resistance and Unstable Readings<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Resistance variation can come from the board, the probe interface, or the measurement setup. In a two-wire measurement, lead and contact resistance can contribute to the reading. Four-wire Kelvin measurement separates current and voltage-sensing paths to reduce those contributions, but still requires proper contact and configuration.<\/p>\n\n\n\n<figure class=\"wp-block-table\"><table><thead><tr><th>Observation<\/th><th>Priority Checks<\/th><\/tr><\/thead><tbody><tr><td>Readings fluctuate at one pad<\/td><td>Tip condition, landing position, pad contamination, and board movement<\/td><\/tr><tr><td>Several unrelated nets fail on one head<\/td><td>Probe assembly, connections, alignment, and system verification<\/td><\/tr><tr><td>A net remains high with verified contact<\/td><td>Conductor geometry, interconnection condition, and test requirements<\/td><\/tr><tr><td>Results change after probe replacement<\/td><td>Correct part, installation, tip-position verification, and setup<\/td><\/tr><tr><td>Results differ between machines<\/td><td>Program revision, measurement method, limits, and equipment verification<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Corrective action and verification:<\/strong> restore reliable contact, confirm the approved measurement settings, and compare results on a suitable reference board. If a board remains abnormal, use targeted inspection or additional testing rather than repeatedly probing until the result falls within limits.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">4. Shorts and Low Isolation Resistance<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">A short-circuit report and a low-isolation result are related but not identical. A metallic bridge may create a low-resistance connection, while contamination or another leakage path may produce a result that depends on the test conditions.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Separate board checks from system checks<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Board checks:<\/strong> Inspect the identified nets, copper clearances, conductive particles, surface condition, and accessible features.<\/li>\n\n\n\n<li><strong>Program checks:<\/strong> Confirm the reference netlist, revision, panel mapping, and intended isolation pairs.<\/li>\n\n\n\n<li><strong>Contact checks:<\/strong> Verify that the probe lands on the intended pad without bridging nearby conductors.<\/li>\n\n\n\n<li><strong>System checks:<\/strong> Inspect fixtures and test hardware for contamination or leakage using the manufacturer\u2019s verification procedure.<\/li>\n\n\n\n<li><strong>Condition checks:<\/strong> Confirm the specified test voltage, measurement timing, and environmental requirements.<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Verify the result:<\/strong> retain the original data and repeat the approved test after a documented correction. If cleaning changes the result, investigate the contamination source and confirm whether the product requires further assessment. Do not raise the test voltage beyond the approved requirement as an improvised diagnostic step.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">5. Missed Pads, Registration Errors, and Board Deflection<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Probe positioning depends on the test data, fiducial recognition, machine alignment, and stable panel support. A small positioning error may become significant on fine-pitch features.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Checks and corrective actions<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Data and orientation:<\/strong> Verify board revision, top\/bottom transformation, panel origin, and unit numbering.<\/li>\n\n\n\n<li><strong>Fiducials:<\/strong> Check visibility, cleanliness, selection, and recognition results.<\/li>\n\n\n\n<li><strong>Tip position:<\/strong> Perform the prescribed alignment or position verification after replacement or impact.<\/li>\n\n\n\n<li><strong>Panel support:<\/strong> Inspect clamping, flatness, support locations, and movement during probing.<\/li>\n\n\n\n<li><strong>Local geometry:<\/strong> Confirm that the contact point is large enough and clear of nearby obstructions.<\/li>\n\n\n\n<li><strong>Height control:<\/strong> Use the machine\u2019s approved procedure for board height and contact settings.<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Verify the result:<\/strong> inspect actual landing positions on representative features across the panel, including edges and areas with prior failures. Confirm that a correction improves contact without moving the probe toward adjacent conductors.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">6. Excessive Probe Marks and Damaged Pads<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Physical-contact testing can leave witness marks. Whether a mark is acceptable depends on the surface finish, location, depth, and product requirements. A light contact mark should not automatically be classified as damage, but exposed substrate, lifted copper, or displaced features requires evaluation.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>What to check<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Tip selection:<\/strong> Confirm compatibility with the tester, head, pad geometry, and finish.<\/li>\n\n\n\n<li><strong>Tip condition:<\/strong> Inspect for bending, chipping, deposits, or uneven wear.<\/li>\n\n\n\n<li><strong>Contact settings:<\/strong> Verify engagement and force according to the equipment instructions.<\/li>\n\n\n\n<li><strong>Alignment:<\/strong> Check whether the tip contacts the center of the intended area.<\/li>\n\n\n\n<li><strong>Repeat touches:<\/strong> Review retries that may repeatedly strike the same location.<\/li>\n\n\n\n<li><strong>Support:<\/strong> Check whether the board bends under contact.<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Corrective action and verification:<\/strong> restore the approved probing setup, replace damaged parts where necessary, and inspect fresh contact locations. Soft-touch operation may help control contact on compatible systems, but it does not guarantee a mark-free surface.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">7. Probe Maintenance, Replacement, and Test-Time Changes<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">Replace probes based on condition and performance rather than a universal contact-count claim. Contamination and wear can affect contact reliability, while excessive retries may increase both cycle time and repeated marking.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Welleltron lists <a href=\"https:\/\/welleltron.com\/blog\/flying-probe-tester\/\">ATG replacement probes<\/a>, including the 3A101804 and other needle configurations. Select replacements by verified part number, tester configuration, and intended contact arrangement. Do not infer tester accuracy, speed, or measurement capability from the needle alone. <\/p>\n\n\n\n<figure class=\"wp-block-table\"><table><thead><tr><th>Maintenance or Selection Task<\/th><th>What to Confirm<\/th><\/tr><\/thead><tbody><tr><td>Probe cleaning<\/td><td>Manufacturer-approved method and materials<\/td><\/tr><tr><td>Needle replacement<\/td><td>Correct part number, geometry, mounting, and condition<\/td><\/tr><tr><td>Post-replacement setup<\/td><td>Required tip-position, height, alignment, and contact checks<\/td><\/tr><tr><td>Reference-board verification<\/td><td>Suitable reference condition and approved test program<\/td><\/tr><tr><td>Cycle-time investigation<\/td><td>Retry count, failure distribution, path changes, and measurement settings<\/td><\/tr><tr><td>Product inquiry<\/td><td>Machine model, serial number, existing part, photographs, and application<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Do not shorten the test by disabling required checks or relaxing acceptance limits.<\/strong> First determine whether the extra time comes from contact retries, a revised program, additional coverage, or equipment behavior.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\">To prevent recurrence, keep records of probe changes, cleaning, alignment, failure patterns, and reference-board results.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">8. Verify the Root Cause Before Releasing the Board<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\">A troubleshooting change should produce repeatable results without reducing the intended test coverage. Boards affected by unresolved intermittent failures should remain under the applicable quality-disposition process.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Release checklist<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Confirm the correct board and test-program revisions.<\/li>\n\n\n\n<li>Preserve original failures and the complete retest history.<\/li>\n\n\n\n<li>Document the physical or setup change that resolved the issue.<\/li>\n\n\n\n<li>Verify contact and equipment performance using the approved procedure.<\/li>\n\n\n\n<li>Repeat the required continuity and isolation tests.<\/li>\n\n\n\n<li>Inspect affected pads for unacceptable contact damage.<\/li>\n\n\n\n<li>Use additional board inspection where an intermittent conductor or interconnection defect remains possible.<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\">Passing continuity and isolation tests confirms performance within the tested conditions. It does not independently establish copper thickness, long-term reliability, or the absence of every internal defect.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">FAQ<\/h2>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Does a flying probe open always mean a broken PCB trace?<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">No. Poor contact, an inaccessible point, incorrect coordinates, or a program mismatch can also produce an open report. Verify the test setup before diagnosing the board.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Can I fix intermittent test failures just by raising contact force?<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Not recommended. If the probe tip is glazed or worn, higher force only increases pad scratch risk. Replacing the probe is the reliable solution.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Why do resistance readings change after cleaning the probe?<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Contamination at the contact interface may have affected the measurement. Verify the improvement on a suitable reference and check whether cleaning or surface contamination is causing recurring problems.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>What is the most common reason for false open circuits in flying probe test?<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Worn and flat probe tips are the top cause. The probe cannot break through light oxide or flux residue on pads. Check probe status before rechecking PCB circuits.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>When should an ATG probe be replaced?<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Replace it when damage, wear, or persistent contact instability remains after approved cleaning and setup checks. Complete the required verification before resuming production.<\/p>\n\n\n<style>.wp-block-kadence-advancedheading.kt-adv-heading4852_dc0980-f4, .wp-block-kadence-advancedheading.kt-adv-heading4852_dc0980-f4[data-kb-block=\"kb-adv-heading4852_dc0980-f4\"]{font-style:normal;}.wp-block-kadence-advancedheading.kt-adv-heading4852_dc0980-f4 mark.kt-highlight, .wp-block-kadence-advancedheading.kt-adv-heading4852_dc0980-f4[data-kb-block=\"kb-adv-heading4852_dc0980-f4\"] mark.kt-highlight{font-style:normal;color:#f76a0c;-webkit-box-decoration-break:clone;box-decoration-break:clone;padding-top:0px;padding-right:0px;padding-bottom:0px;padding-left:0px;}.wp-block-kadence-advancedheading.kt-adv-heading4852_dc0980-f4 img.kb-inline-image, .wp-block-kadence-advancedheading.kt-adv-heading4852_dc0980-f4[data-kb-block=\"kb-adv-heading4852_dc0980-f4\"] img.kb-inline-image{width:150px;vertical-align:baseline;}<\/style>\n<p class=\"kt-adv-heading4852_dc0980-f4 wp-block-kadence-advancedheading\" data-kb-block=\"kb-adv-heading4852_dc0980-f4\"><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Flying probe testing checks electrical connections by moving probes to programmed locations on a PCB. Common problems include reported opens, shorts, unstable resistance readings, missed test points, and excessive probe marks. A failed result may indicate a real board defect, a contact problem, or an incorrect test setup. 1. Understand What the Flying Probe Test&#8230;<\/p>","protected":false},"author":1,"featured_media":0,"parent":4610,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_uag_custom_page_level_css":"","_kad_blocks_custom_css":"","_kad_blocks_head_custom_js":"","_kad_blocks_body_custom_js":"","_kad_blocks_footer_custom_js":"","_kad_post_transparent":"","_kad_post_title":"","_kad_post_layout":"left","_kad_post_sidebar_id":"","_kad_post_content_style":"","_kad_post_vertical_padding":"","_kad_post_feature":"","_kad_post_feature_position":"","_kad_post_header":false,"_kad_post_footer":false,"footnotes":""},"categories":[],"tags":[],"class_list":["post-4852","page","type-page","status-publish","hentry"],"taxonomy_info":[],"featured_image_src_large":false,"author_info":{"display_name":"lucaismilelove@gmail.com","author_link":"https:\/\/welleltron.com\/fr\/blog\/author\/luciasmilelovegmail-com\/"},"comment_info":0,"_hostinger_reach_plugin_has_subscription_block":false,"_hostinger_reach_plugin_is_elementor":false,"spectra_custom_meta":{"_uagb_previous_block_counts":["a:90:{s:21:\"uagb\/advanced-heading\";i:0;s:15:\"uagb\/blockquote\";i:0;s:12:\"uagb\/buttons\";i:0;s:18:\"uagb\/buttons-child\";i:0;s:19:\"uagb\/call-to-action\";i:0;s:15:\"uagb\/cf7-styler\";i:0;s:11:\"uagb\/column\";i:0;s:12:\"uagb\/columns\";i:0;s:14:\"uagb\/container\";i:0;s:21:\"uagb\/content-timeline\";i:0;s:27:\"uagb\/content-timeline-child\";i:0;s:14:\"uagb\/countdown\";i:0;s:12:\"uagb\/counter\";i:0;s:8:\"uagb\/faq\";i:0;s:14:\"uagb\/faq-child\";i:0;s:10:\"uagb\/forms\";i:0;s:17:\"uagb\/forms-accept\";i:0;s:19:\"uagb\/forms-checkbox\";i:0;s:15:\"uagb\/forms-date\";i:0;s:16:\"uagb\/forms-email\";i:0;s:17:\"uagb\/forms-hidden\";i:0;s:15:\"uagb\/forms-name\";i:0;s:16:\"uagb\/forms-phone\";i:0;s:16:\"uagb\/forms-radio\";i:0;s:17:\"uagb\/forms-select\";i:0;s:19:\"uagb\/forms-textarea\";i:0;s:17:\"uagb\/forms-toggle\";i:0;s:14:\"uagb\/forms-url\";i:0;s:14:\"uagb\/gf-styler\";i:0;s:15:\"uagb\/google-map\";i:0;s:11:\"uagb\/how-to\";i:0;s:16:\"uagb\/how-to-step\";i:0;s:9:\"uagb\/icon\";i:0;s:14:\"uagb\/icon-list\";i:0;s:20:\"uagb\/icon-list-child\";i:0;s:10:\"uagb\/image\";i:0;s:18:\"uagb\/image-gallery\";i:0;s:13:\"uagb\/info-box\";i:0;s:18:\"uagb\/inline-notice\";i:0;s:11:\"uagb\/lottie\";i:0;s:21:\"uagb\/marketing-button\";i:0;s:10:\"uagb\/modal\";i:0;s:18:\"uagb\/popup-builder\";i:0;s:16:\"uagb\/post-button\";i:0;s:18:\"uagb\/post-carousel\";i:0;s:17:\"uagb\/post-excerpt\";i:0;s:14:\"uagb\/post-grid\";i:0;s:15:\"uagb\/post-image\";i:0;s:17:\"uagb\/post-masonry\";i:0;s:14:\"uagb\/post-meta\";i:0;s:18:\"uagb\/post-taxonomy\";i:0;s:18:\"uagb\/post-timeline\";i:0;s:15:\"uagb\/post-title\";i:0;s:20:\"uagb\/restaurant-menu\";i:0;s:26:\"uagb\/restaurant-menu-child\";i:0;s:11:\"uagb\/review\";i:0;s:12:\"uagb\/section\";i:0;s:14:\"uagb\/separator\";i:0;s:11:\"uagb\/slider\";i:0;s:17:\"uagb\/slider-child\";i:0;s:17:\"uagb\/social-share\";i:0;s:23:\"uagb\/social-share-child\";i:0;s:16:\"uagb\/star-rating\";i:0;s:23:\"uagb\/sure-cart-checkout\";i:0;s:22:\"uagb\/sure-cart-product\";i:0;s:15:\"uagb\/sure-forms\";i:0;s:22:\"uagb\/table-of-contents\";i:0;s:9:\"uagb\/tabs\";i:0;s:15:\"uagb\/tabs-child\";i:0;s:18:\"uagb\/taxonomy-list\";i:0;s:9:\"uagb\/team\";i:0;s:16:\"uagb\/testimonial\";i:0;s:14:\"uagb\/wp-search\";i:0;s:19:\"uagb\/instagram-feed\";i:0;s:10:\"uagb\/login\";i:0;s:17:\"uagb\/loop-builder\";i:0;s:18:\"uagb\/loop-category\";i:0;s:20:\"uagb\/loop-pagination\";i:0;s:15:\"uagb\/loop-reset\";i:0;s:16:\"uagb\/loop-search\";i:0;s:14:\"uagb\/loop-sort\";i:0;s:17:\"uagb\/loop-wrapper\";i:0;s:13:\"uagb\/register\";i:0;s:19:\"uagb\/register-email\";i:0;s:24:\"uagb\/register-first-name\";i:0;s:23:\"uagb\/register-last-name\";i:0;s:22:\"uagb\/register-password\";i:0;s:30:\"uagb\/register-reenter-password\";i:0;s:19:\"uagb\/register-terms\";i:0;s:22:\"uagb\/register-username\";i:0;}"],"_edit_lock":["1793872824:1"],"rank_math_internal_links_processed":["1"],"rank_math_seo_score":["76"],"rank_math_title":["Flying Probe Test Issues"],"rank_math_focus_keyword":["Probe"],"_uag_custom_page_level_css":[""],"_kad_blocks_custom_css":[""],"_kad_blocks_head_custom_js":[""],"_kad_blocks_body_custom_js":[""],"_kad_blocks_footer_custom_js":[""],"_kad_post_transparent":[""],"_kad_post_title":[""],"_kad_post_layout":["left"],"_kad_post_sidebar_id":[""],"_kad_post_content_style":[""],"_kad_post_vertical_padding":[""],"_kad_post_feature":[""],"_kad_post_feature_position":[""],"_kad_post_header":[""],"_kad_post_footer":[""],"footnotes":[""],"_elementor_edit_mode":[""],"_elementor_template_type":[""],"_elementor_data":[""],"_elementor_conditions":["a:0:{}"],"_edit_last":["1"],"_wp_page_template":["default"],"_uag_css_file_name":["uag-css-4852.css"],"_elementor_page_assets":["a:0:{}"],"_uag_page_assets":["a:9:{s:3:\"css\";s:260:\".uag-blocks-common-selector{z-index:var(--z-index-desktop) !important}@media(max-width: 976px){.uag-blocks-common-selector{z-index:var(--z-index-tablet) !important}}@media(max-width: 767px){.uag-blocks-common-selector{z-index:var(--z-index-mobile) !important}}\";s:2:\"js\";s:0:\"\";s:18:\"current_block_list\";a:29:{i:0;s:23:\"kadence\/tableofcontents\";i:1;s:14:\"core\/paragraph\";i:2;s:12:\"core\/heading\";i:3;s:10:\"core\/table\";i:4;s:9:\"core\/list\";i:5;s:14:\"core\/list-item\";i:6;s:23:\"kadence\/advancedheading\";i:7;s:9:\"core\/code\";i:8;s:10:\"core\/group\";i:9;s:12:\"core\/columns\";i:10;s:14:\"core\/tag-cloud\";i:11;s:17:\"core\/social-links\";i:12;s:10:\"core\/video\";i:13;s:15:\"core\/media-text\";i:14;s:10:\"core\/audio\";i:15;s:10:\"core\/image\";i:16;s:10:\"core\/verse\";i:17;s:14:\"core\/pullquote\";i:18;s:17:\"core\/preformatted\";i:19;s:12:\"core\/details\";i:20;s:14:\"core\/page-list\";i:21;s:18:\"core\/legacy-widget\";i:23;s:16:\"core\/social-link\";i:24;s:12:\"kadence\/form\";i:25;s:14:\"kadence\/search\";i:26;s:16:\"kadence\/iconlist\";i:27;s:16:\"kadence\/listitem\";i:28;s:12:\"kadence\/icon\";i:29;s:19:\"kadence\/single-icon\";}s:8:\"uag_flag\";b:0;s:11:\"uag_version\";s:10:\"1794077059\";s:6:\"gfonts\";a:0:{}s:10:\"gfonts_url\";s:0:\"\";s:12:\"gfonts_files\";a:0:{}s:14:\"uag_faq_layout\";b:0;}"]},"uagb_featured_image_src":{"full":false,"thumbnail":false,"medium":false,"medium_large":false,"large":false,"1536x1536":false,"2048x2048":false,"trp-custom-language-flag":false,"woocommerce_thumbnail":false,"woocommerce_single":false,"woocommerce_gallery_thumbnail":false},"uagb_author_info":{"display_name":"lucaismilelove@gmail.com","author_link":"https:\/\/welleltron.com\/fr\/blog\/author\/luciasmilelovegmail-com\/"},"uagb_comment_info":0,"uagb_excerpt":"Flying probe testing checks electrical connections by moving probes to programmed locations on a PCB. Common problems include reported opens, shorts, unstable resistance readings, missed test points, and excessive probe marks. A failed result may indicate a real board defect, a contact problem, or an incorrect test setup. 1. Understand What the Flying Probe Test...","_links":{"self":[{"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/pages\/4852","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/comments?post=4852"}],"version-history":[{"count":3,"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/pages\/4852\/revisions"}],"predecessor-version":[{"id":4864,"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/pages\/4852\/revisions\/4864"}],"up":[{"embeddable":true,"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/pages\/4610"}],"wp:attachment":[{"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/media?parent=4852"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/categories?post=4852"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/welleltron.com\/fr\/wp-json\/wp\/v2\/tags?post=4852"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}