{"id":1711,"date":"2025-12-16T06:34:36","date_gmt":"2025-12-16T06:34:36","guid":{"rendered":"https:\/\/welleltron.com\/?post_type=product&p=1711"},"modified":"2025-12-26T05:10:29","modified_gmt":"2025-12-26T05:10:29","slug":"hitachi-cmi700-etp-probe","status":"publish","type":"product","link":"https:\/\/welleltron.com\/es\/test-equipment\/etp-probe\/hitachi-cmi700-etp-probe\/","title":{"rendered":"Hitachi CMI700 ETP probe"},"content":{"rendered":"

Hitachi CMI700 ETP probe <\/strong><\/strong>Overview<\/strong><\/h2>\n
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Hitachi CMI700 ETP probe<\/strong>(Electromagnetic Through-hole Probe) is a specialized sensor designed specifically for the Surface Finishing Industry and Printed Circuit Board (PCB) inspection. Unlike standard surface probes that measure flat areas, the PTH hole ETP probe is engineered to enter small-diameter holes and measure the thickness of the copper barrel.\u00a0 <\/span><\/p>\n

Compatible with the Oxford CMI500 and the newer Hitachi CMI700 series, this ETP probe for CMI500 systems addresses the industry’s need for Non-Destructive Testing (NDT). It allows manufacturers to verify plating quality without sectioning the board, thereby reducing waste and speeding up the Quality Control (QC) process.\u00a0 <\/span><\/p>\n

2. Core Functionality: How the ETP Probe Works\u00a0 <\/span><\/h2>\n

The ETP probe<\/b> operates on the principle of eddy-current induction. When the probe tip is inserted into a hole, it generates an electromagnetic field that induces eddy currents in the copper plating. The probe then measures the impedance change caused by these currents, which is directly proportional to the thickness of the copper.\u00a0 <\/span><\/p>\n

Key Technical Advantages:\u00a0 <\/span><\/h3>\n