{"id":1720,"date":"2025-12-16T06:47:22","date_gmt":"2025-12-16T06:47:22","guid":{"rendered":"https:\/\/welleltron.com\/?post_type=product&p=1720"},"modified":"2026-11-03T12:41:07","modified_gmt":"2026-11-03T12:41:07","slug":"atg-3a101804-flying-probe","status":"publish","type":"product","link":"https:\/\/welleltron.com\/de\/test-equipment\/atg-test-probe\/atg-3a101804-flying-probe\/","title":{"rendered":"ATG 3A101804 Flying Probe"},"content":{"rendered":"

1.ATG 3A101804 Flying Probe Overview<\/h2>\n

ATG 3A101804 is a high-precision test probe designed for ATG flying probe tester<\/a>, which is the core component of the flying probe test system. The flying probe tester collects electrical signals (such as resistance, voltage, current, etc.) by moving the probe at high speed and contacting the component pins or solder joints on the PCB board, and combines algorithm analysis to determine the connection status between components (such as leaking solder, cold solder, open circuit, short circuit, etc.), thereby verifying the electrical reliability of the PCB.<\/p>\n

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2.ATG probe Features<\/h2>\n
High-precision mechanical structure<\/span><\/strong><\/div>\n

Needle diameter:\u00a0<\/strong>0.1-0.3mm (suitable for high-density PCB, such as mobile phone motherboards, smart wearable devices).<\/span><\/h3>\n

Stroke:\u00a0<\/strong>1-5mm (adjustable to ensure that the probe stably contacts the component pins to avoid crushing the solder joints).<\/span><\/h3>\n

Repeat positioning accuracy:<\/strong>\u00a0\u00b10.005mm (to ensure that the probe contact position is consistent during multiple tests).<\/span><\/h3>\n

3.High-speed dynamic performance<\/h2>\n
<\/div>\n
Moving speed:<\/strong>\u00a0maximum 1m\/s (the moving speed of the probe in the X\/Y\/Z axis directly affects the test efficiency).<\/span><\/div>\n
Acceleration:<\/strong>\u00a0\u22655G (fast response to test point switching, reducing non-test time).<\/span><\/div>\n
Single-point test time:\u00a0<\/strong><50ms (total time from probe movement to contact and completion of signal acquisition).<\/span><\/div>\n
Electrical performance<\/span><\/strong><\/div>\n
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Contact resistance:\u00a0<\/strong><\/span>\u22640.1\u03a9 (low impedance design to reduce test signal attenuation).<\/p>\n<\/div>\n

Withstand voltage:\u00a0<\/strong>\u2265500V (suitable for high-voltage component testing, such as power modules).<\/span><\/div>\n
Bandwidth:\u00a0<\/strong>\u2265100MHz (high-frequency signal testing capability to meet the needs of high-speed digital circuits).<\/span><\/div>\n

4.Durability and lifespan<\/h2>\n
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Contact times:<\/strong>\u00a0\u2265500,000 times (depending on the material, such as beryllium copper probes have a longer lifespan).<\/span><\/div>\n
Maintenance cycle: It is recommended to clean the oxide layer on the probe surface after every 100,000 tests to extend the service life.<\/span><\/div>\n
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Besides 3A101804 hard touch needle pin, we also have ATG test pin of below<\/span><\/div>\n
Softtouch Needle\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a03A101816K2<\/span><\/div>\n
Micro Needle\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0A3S104010KS30<\/span><\/div>\n
Kelvin Needle Blade\u00a0 \u00a0 \u00a0 \u00a0A3A101822K<\/span><\/div>\n
Kelvin Needle\u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0 \u00a0A3A101821KS\"\"<\/span><\/div>\n
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